Reliability test of components is the main means to obtain reliability data, and also the basis for reliability estimation of components. There are many factors affecting the reliability of components: external stresses in a broad sense (such as electrical stresses: current, electrical music, electrical power; environmental stresses: temperature, humidity, low pressure radiation, etc.; mechanical stresses: vibration shock, acceleration, etc.) can affect the performance and life of components. Film capacitor wholesale, so the purpose of reliability test is to simulate the comprehensive effect of various external stresses, in order to obtain the actual failure rate data and analyze the characteristics and degree of impact of various stresses on the performance and life of the components, so as to make a realistic analysis of the failure mechanism. Accordingly, the reliability test can be broadly divided into two categories: life test and environmental test.
Life test is to have been identified as qualified components in the – a fixed voltage and temperature conditions for long-term test, the measurement and test time corresponding to the cumulative failure rate of the components (usually expressed as a percentage) and graph the failure characteristics of the components curve which corresponds to the test time T1, the cumulative failure rate of the components rose significantly (at this time a large number of components failed), T1 is the effective working time of the components; and The test time corresponding to 50% of the component damage 2 is the average life time of the batch of components, which is usually used to compare the relative quality of various components or different batches of components in the production line. It takes a considerable amount of time to conduct a life test [e.g., a component with a failure rate of 100 fet (i.e., 0.01% per thousand hours) has a failure within 10 million component hours], so the accelerated life test method is adopted to shorten the test time. The accelerated life test is a life test performed on a limited number of specimens under higher than normal stress conditions to accelerate the failure of the component, so that the required reliability data can be obtained in a short period of time, and the failure rate of the component under operating conditions can be deduced.
15000uf 80 V elektrolytisk kondensator

15000uf 80 V elektrolytisk kondensator

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